Year 2011
Authors Li, Yiming
Paper Title Yiming Li, Chih-Hong Hwang, Ta-Ching Yeh, and Hsuan-Ming Huang, “Reduction of Discrete-Dopant-Induced High-Frequency Characteristic Fluctuations in Nanoscale CMOS Circuit,” Proceedings of The 2008 IEEE International Conference on Simulation of Semiconductor Processes and Devices (IEEE SISPAD 2008), Yumoto Fujiya Hotel, Hakone, JAPAN, Sept. 9-11, 2008, pp. 209-212.
Date of Publication 2011-08-01