Year	2011
Authors	Li, Yiming
Paper Title	Yiming Li, Chih-Hong Hwang, Ta-Ching Yeh, and Ming-Hung Han, “Simulation of Electrical Characteristic Fluctuation in 16-nm FinFETs and Circuits,” Proceedings of The IEEE Device Research Conference (IEEE DRC 2009), Penn State University, PA, USA, June 22-24, 2009, pp. 139-140.
Date of Publication	2011-08-01