Year | 2011 |
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Authors | Li, Yiming |
Paper Title | Yiming Li, Chih-Hong Hwang, Ta-Ching Yeh, and Tien-Yeh Li “Large-Scale Atomistic Approach to Random-Dopant-Induced Characteristic Variability in Nanoscale CMOS Digital and High-Frequency Integrated Circuits,” Proceedings of The 2008 IEEE/ACM International Conference on Computer-Aided Design (IEEE/ACM ICCAD 2008), San Jose, CA, USA, Nov.10-13, 2008, pp. 278-285. |
Date of Publication | 2011-08-01 |