Year	2011
Authors	Li, Yiming
Paper Title	Yiming Li, Chih-Hong Hwang, Ta-Ching Yeh, and Tien-Yeh Li “Large-Scale Atomistic Approach to Random-Dopant-Induced Characteristic Variability in Nanoscale CMOS Digital and High-Frequency Integrated Circuits,” Proceedings of The 2008 IEEE/ACM International Conference on Computer-Aided Design (IEEE/ACM ICCAD 2008), San Jose, CA, USA, Nov.10-13, 2008, pp. 278-285.
Date of Publication	2011-08-01