Year 2011
Authors Li, Yiming
Paper Title Yiming Li, Chih-Hong Hwang, and Shao-Ming Yu, “Numerical Simulation of Static Noise Margin for A Six-Transistor Static Random Access Memory Cell with 32nm Fin-typed Field Effect Transistors,” Presented in International Conference on Computational Science 2007 (ICCS 2007), Graduate University of the Chinese Academy of Sciences, Beijing, China, May 27-30, 2007; Published in Lecture Notes in Computer Science, Vol. LNCS 4490, June 2007, pp. 227-234.
Date of Publication 2011-08-01