Year 2011
Authors Li, Yiming
Paper Title Yiming Li, Chih-Hong Hwang and Ta-Ching Yeh, “Asymmetric Gate Capacitance and High Frequency Characteristic Fluctuations in 16 nm Bulk MOSFETs Due to Random Distribution of Discrete Dopants,”Accepted by The 2008 IEEE Silicon Nanoelectronics Workshop (IEEE SNW 2008), Honolulu, HI, USA,June 15-16, 2008.
Date of Publication 2011-08-01