Year	2011
Authors	Li, Yiming
Paper Title	Yiming Li, Chun-Yen Yiu, Ming-Hung Han and Hui-Wen Cheng, “Nanosized-Metal-Grain-Induced Characteristic Fluctuation in 16-nm CMOS Devices,” Proceedings of 2010 International Conference on Solid State Devices and Materials (SSDM 2010), Tokyo, Japan, Sep. 22-24, 2010, pp. 305-306.
Date of Publication	2011-08-01