Year	2011
Authors	Li, Yiming
Paper Title	Yiming Li, Jung Y. Huang, Bo-Shian Lee, and Chih-Hong Hwang, “Single Grain Boundary Effect on Surrounding-Gate Polysilicon TFT's Device and Circuit Characteristic,” Accepted by The 7th IEEE International Conference on Nanotechnology (IEEE-NANO 07), Hong Kong Convention & Exhibition Centre,Hong Kong, China, Aug. 2-5, 2007.
Date of Publication	2011-08-01