Year 0000
Authors Li, Yiming
Paper Title Yiming Li, Shao-Ming Yu, and Ching-Feng Hsiao,, "Study of Threshold Voltage Fluctuations of Nanoscale Double Gate Metal-Oxide-Semiconductor Field Effect Transistors Using Quantum Correction Simulation,", Accepted by the 15th edition of the Workshop on the Modeling and Simulation of Electron Devices (MSED 2005), Polo Carmignani, Università di, Pisa, Italy, 2005年07月
Date of Publication 1970-01-01