Year	2011
Authors	Li, Yiming
Paper Title	Yiming Li, Shao-Ming Yu, and Hung-Ming Chen “Process-Variation- and Random-Dopants-Induced Threshold Voltage Fluctuations in Nanoscale CMOS and SOI Devices,” Presented in The IEEE 15th Biannual Conference Insulating Films on Semiconductors (IEEE INFOS 07), Athens, Greece, June 20-23,2007.
Date of Publication	2011-08-01