Year | 2011 |
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Authors | Li, Yiming |
Paper Title | Yiming Li, Shao-Ming Yu, and Hung-Ming Chen “Process-Variation- and Random-Dopants-Induced Threshold Voltage Fluctuations in Nanoscale CMOS and SOI Devices,” Presented in The IEEE 15th Biannual Conference Insulating Films on Semiconductors (IEEE INFOS 07), Athens, Greece, June 20-23,2007. |
Date of Publication | 2011-08-01 |