Year	2011
Authors	Li, Yiming
Paper Title	Yiming Li and Bo-Shian Lee, “Grain Boundary Effect in Sub-100 nm Surrounding-Gate Polysilicon Thin Film Transistors,” Proceedings of The 6th IEEE Conference on Nanotechnology (IEEE-NANO 06),Cincinnati, Ohio, U.S.A., July 16-20, 2006, pp. 504-507.
Date of Publication	2011-08-01