Year	2011
Authors	Li, Yiming
Paper Title	Yiming Li and Chien-Sung Lu, “Static Noise Margin of SRAM Cells with 35 nm SOI FinFETs,” Presented in The 2006 IEEE Silicon Nanoelectronics Workshop (IEEE SNW 2006), Honolulu, Hawaii, U.S.A., June 11-12, 2006.
Date of Publication	2011-08-01