Year	2011
Authors	Li, Yiming
Paper Title	Yiming Li and Shao-Ming Yu, “Comparison of Threshold Voltage Fluctuations in Sub-45 nm Planar MOSFET and Thin-Buried-Oxide SOI Devices,” Accepted by The 2006 International Conference on Solid State Devices and Materials (SSDM 2006), Yokohama, Japan, September 12-15, 2006.
Date of Publication	2011-08-01