Year | 2011 |
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Authors | Li, Yiming |
Paper Title | Yiming Li and Shao-Ming Yu, “Random Dopant-Induced Fluctuations of Electrical Characteristics in Nanoscale Single- and Double-Gate MOSFETs,” Book of Abstract of The 6th International Conference of Scientific Computing in Electrical Engineering (SCEE 2006), Sinaia, Romania, 17-22 September 2006, pp.154-155. |
Date of Publication | 2011-08-01 |