Year	2011
Authors	Li, Yiming
Paper Title	Yiming Li and Shao-Ming Yu, “Random Dopant-Induced Fluctuations of Electrical Characteristics in Nanoscale Single- and Double-Gate MOSFETs,” Book of Abstract of The 6th International Conference of Scientific Computing in Electrical Engineering (SCEE 2006), Sinaia, Romania, 17-22 September 2006, pp.154-155.
Date of Publication	2011-08-01