Year	0000
Authors	Li, Yiming
Paper Title	Yiming Li and Shao-Ming Yu, "Quantum Correction Simulation of Random Dopant-Induced Threshold Voltage Fluctuations in Nanoscale Metal-Oxide-Semiconductor Structures,", Accepted by IEEE Conference on Nanotechnology (IEEE NANO 2005), Nagoya Congress Center, Nagoya, Japan, 2005年07月
Date of Publication	1970-01-01