Year	2011
Authors	Li, Yiming
Paper Title	Yiming Li and Wei-Hsin Chen, “Simulation of Nanoscale Round-Top-Gate Bulk FinFETs with Optimal Geometry Aspect Ratio,” Proceedings of The 6th IEEE Conference on Nanotechnology (IEEE-NANO 06),Cincinnati, Ohio, U.S.A., July 16-20, 2006, pp. 569-572.
Date of Publication	2011-08-01