Year	2009
Authors	Li, Yiming
Paper Title	Jam-Wem Lee and Yiming Li, "Effective Electrostatic Discharge Protection Circuit Design Using Novel Full-Silicided N-MOSFETs in Sub-100 nm Device era" , IEEE Transactions on Nanotechnology, Vol. 5, No. 3, July 2006, pp. 211-215 (SCI期刊), 2006年07月
Date of Publication	2009-03-31