Year	2009
Authors	Li, Yiming
Paper Title	Shao-Ming Yu, Jam-Wem Lee, and Yiming Li, "An Optimal Silicidation Technique for Electrostatic Discharge Protection Sub-100 nm CMOS Devices in VLSI Circuit" , Microelectronic Engineering, Vol. 84, No. 2, Feb. 2007, pp. 213-217 (SCI期刊), 2007年02月
Date of Publication	2009-03-31