Year 2009
Authors Li, Yiming
Paper Title

Tien-Sheng Chao, Yao-Jen Lee, Chun-Yang Huang, Horng-Chih Lin, Yiming Li, and Tiao-Yuan Huang, "Hot Carrier Degradations of Dynamic Threshold Silicon on Insulator p-Type Metal–Oxide–Semiconductor Field Effect Transistors" , Japanese Journal of Applied Physics, Vol. 43, No. 4A, April 2004, pp. 1300-1304 (SCI期刊), 2004年04月
Date of Publication 2009-05-12