Year	2011
Authors	Li, Yiming
Paper Title	Yiming Li, Chih-Hong Hwang and Hui-Wen Cheng, "Discrete-Dopant-Fluctuated Transient Behavior and Variability Suppression in 16-nm-Gate Complementary Metal-Oxide-Semiconductor Field Effect Transistors" , Japanese Journal of Applied Physics, Vol. 48, No. 4, Apr. 2009, 04C051 (9pp). (SCI期刊) , 2009年04月
Date of Publication	2011-04-19