Year 2009
Authors Li, Yiming
Paper Title

Yiming Li, Chih-Hong Hwang and Hui-Wen Cheng, "Process-Variation- and Random-Dopants-Induced Threshold Voltage Fluctuations in Nanoscale Planar MOSFET and Bulk FinFET Devices" , Microelectronic Engineering, Vol. 86, No. 3, March 2009, pp. 277-282 (SCI期刊), 2009年03月
Date of Publication 2009-03-30