Year	2011
Authors	Li, Yiming
Paper Title	Yiming Li, Hui-Wen Cheng, and Ming-Hung Han, "Statistical Simulation of Static Noise Margin Variability in Static Random Access Memory" , IEEE Transactions on Semiconductor Manufacturing, Vol. 23, No. 4, Nov. 2010, pp. 509-516. (SCI期刊), 2010年11月
Date of Publication	2011-04-01