Year | 2003 |
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Authors | Li, Yiming |
Paper Title | Yiming Li, Jam-Wem Lee, and Simon M. Sze, "Optimization of the Anti-Punch-Through Implant for ESD Protection Circuit Design", Japanese Journal of Applied Physics, Vol. 42, No. 4B, April 2003, pp. 2152-2155., 2003年04月 |
Date of Publication | 1970-01-01 |
Language | Chinese |