Year	2003
Authors	Li, Yiming
Paper Title	Yiming Li, Jam-Wem Lee, and Simon M. Sze, "Optimization of the Anti-Punch-Through Implant for ESD Protection Circuit Design", Japanese Journal of Applied Physics, Vol. 42, No. 4B, April 2003, pp. 2152-2155., 2003年04月
Date of Publication	1970-01-01
Language	Chinese