Year | 2009 |
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Authors | Li, Yiming |
Paper Title | Yiming Li, Shao-Ming Yu, Jiunn-Ren Hwang, and Fu-Liang Yang, "Discrete Dopant Fluctuations in 20-nm/15nm-Gate Planar CMOS" , IEEE Transactions on Electron Devices, Vol. 55, No. 6, June 2008, pp. 1449-1455 (SCI期刊), 2008年06月 |
Date of Publication | 2009-03-31 |