Year | 2009 |
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Authors | Li, Yiming |
Paper Title | Yiming Li, Shao-Ming Yu, and Hung-Ming Chen, "Process-Variation- and Random-Dopants-Induced Threshold Voltage Fluctuations in Nanoscale CMOS and SOI Devices" , Microelectronic Engineering, Vol. 84, No. 9-10, Sep.-Oct. 2007, pp. 2117-2120 (SCI期刊), 2007年09月 |
Date of Publication | 2009-03-31 |