Year	2009
Authors	Li, Yiming
Paper Title	Yiming Li, Shao-Ming Yu, and Hung-Ming Chen, "Process-Variation- and Random-Dopants-Induced Threshold Voltage Fluctuations in Nanoscale CMOS and SOI Devices" , Microelectronic Engineering, Vol. 84, No. 9-10, Sep.-Oct. 2007, pp. 2117-2120 (SCI期刊), 2007年09月
Date of Publication	2009-03-31