Year	2009
Authors	Li, Yiming
Paper Title	Yiming Li and Chih-Hong Hwang, "Effect of Fin Angle on Electrical Characteristics of Nanoscale Round-Top-Gate Bulk FinFETs" , IEEE Transactions on Electron Devices, Vol. 54, No. 12, Dec. 2007, pp. 3426-3429 (SCI期刊), 2007年12月
Date of Publication	2009-03-31