Year	2009
Authors	Li, Yiming
Paper Title	Yiming Li and Chih-Hong Hwang, "Electrical Characteristic Fluctuations in 16nm Bulk-FinFET Devices" , Microelectronic Engineering, Vol. 84, No. 9-10, Sep.-Oct. 2007, pp. 2093-2096 (SCI期刊), 2007年09月
Date of Publication	2009-03-31