Year	2009
Authors	Li, Yiming
Paper Title	Yiming Li and Chih-Hong Hwang, "High-Frequency Characteristic Fluctuations of Nano-MOSFET Circuit Induced by Random Dopants" , IEEE Transactions on Microwave Theory and Techniques, Vol. 56, No. 12, Dec. 2008, pp. 2726-2733 (SCI期刊), 2008年12月
Date of Publication	2009-03-31