Year | 2009 |
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Authors | Li, Yiming |
Paper Title | Yiming Li and Chih-Hong Hwang, "High-Frequency Characteristic Fluctuations of Nano-MOSFET Circuit Induced by Random Dopants" , IEEE Transactions on Microwave Theory and Techniques, Vol. 56, No. 12, Dec. 2008, pp. 2726-2733 (SCI期刊), 2008年12月 |
Date of Publication | 2009-03-31 |