Year	2009
Authors	Li, Yiming
Paper Title	Yiming Li and Hung-Mu Chou, "A Comparative Study of Electrical Characteristic on Sub-10 nm Double Gate MOSFETs" , IEEE Transactions on Nanotechnology, Vol. 4, No. 5, Sep. 2005, pp. 645-647 (SCI期刊), 2005年09月
Date of Publication	2009-03-31