Year	2009
Authors	Li, Yiming
Paper Title	Yiming Li and Shao-Ming Yu, "Study of Threshold Voltage Fluctuations of Nanoscale Double Gate Metal-Oxide-Semiconductor Field Effect Transistors Using Quantum Correction Simulation" , Journal of Computational Electronics, Vol. 5, No. 2-3, July 2006, pp. 125-129 (EI期刊), 2006年07月
Date of Publication	2009-03-31