Year	2009
Authors	Li, Yiming
Paper Title	Yiming Li and Wei-Hsin Chen, "Numerical Simulation of Electrical Characteristics for Nanoscale MOSFETs with Si/GaAs Channel Film" , Journal of Computational Electronics, Vol. 5, No. 2-3, July 2006, pp. 255-258 (EI期刊), 2006年07月
Date of Publication	2009-03-31