恭贺电机系研究生 汤忠礼、梁家为与萧铭贤 的研究成果
"SEM-Latch: A Lost-Cost and High-Performance Latch Design for Mitigating Soft Errors in Nanoscale CMOS Process" 
获选 ACMIEEE Design Automation Conference (DAC) 2022 顶尖国际会议论文

这是一张图片恭贺电机系研究生 汤忠礼、梁家为与萧铭贤 的研究成果
"SEM-Latch: A Lost-Cost and High-Performance Latch Design for Mitigating Soft Errors in Nanoscale CMOS Process" 
获选 ACMIEEE Design Automation Conference (DAC) 2022 顶尖国际会议论文

编辑