年度	2011
全部作者	李义明
论文名称	Fu-Liang Yang, Jiunn-Ren Hwang, and Yiming Li, “Electrical Characteristic Fluctuations in Sub-45nm CMOS Devices,” Proceedings of The 2006 IEEE Custom Integrated Circuits Conference (IEEE CICC 2006), San Jose, California, U.S.A., Sept. 10-13, 2006, pp. 691-694.
发表日期	2011-08-01