年度 | 2009 |
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全部作者 | 李义明 |
论文名称 | Yiming Li, Hung-Ming Chen, Shao-Ming Yu, Jiunn-Ren Hwang, and Fu-Liang Yang, "Strained CMOS Devices with Shallow-Trench-Isolation Stress Buffer Layers" , IEEE Transactions on Electron Devices, Vol. 55, No. 4, Apr. 2008, pp. 1085-1089 (SCI期刊), 2008年04月 |
发表日期 | 2009-03-31 |