年度 | 2011 |
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全部作者 | 李義明 |
論文名稱 | Yiming Li and Wei-Hsin Chen, “Simulation of Nanoscale Round-Top-Gate Bulk FinFETs with Optimal Geometry Aspect Ratio,” Proceedings of The 6th IEEE Conference on Nanotechnology (IEEE-NANO 06),Cincinnati, Ohio, U.S.A., July 16-20, 2006, pp. 569-572. |
發表日期 | 2011-08-01 |